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名   称 2000-Atmosphere Chip-Scale Packaged Bulk-Type Pressure Sensor with Dual-Cavity Induced Stress Amplification
科技资源标识 CSTR:11738.14.NCDC.XDA14.PP6159.2024
DOI 10.1109/Transducers50396.2021.9495537
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摘   要 Characterized up to a pressure of 200 MPa, a bulk-type single-cavity pressure sensor with a sensitivity of 79μV/V/MPa was previously reported. However, the capability of such a construction had not been fully realized since the pressure sensitivity was limited by the bulging of the surface on which the piezoresistive sensors were constructed. Presently reported is an improved dual-cavity design that incorporates a pressure sensing middle plate sandwiched between two vacuum-sealed cavities. Guided by finite-element analysis, the thickness of the sensing plate and the height of the cavities have been optimized. Over the same pressure range of 200 MPa, the new sensor exhibits a pressure sensitivity of 200 μV/V/MPa . This is 2.5× higher than that of the single-cavity design. In addition, a new chip-scale packaging scheme is proposed, providing silicon columns functioning as both electrical leads and stress-relieving structures.
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作者 林德泉,王文,周显良
数据量 2.6 MiB
论文类型: conference
论文网址: 2000-Atmosphere Chip-Scale Packaged Bulk-Type Pressure Sensor with Dual-Cavity Induced Stress Amplification | IEEE Conference Publication | IEEE Xplore
期刊名称: IEEE Xplore,Transducers Conference
出版时间: 2021-09-01
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数据引用
林德泉,王文,周显良. 2000-Atmosphere Chip-Scale Packaged Bulk-Type Pressure Sensor with Dual-Cavity Induced Stress Amplification. 国家冰川冻土沙漠科学数据中心(http://www.ncdc.ac.cn), 2024. https://cstr.cn/CSTR:11738.14.NCDC.XDA14.PP6159.2024.
林德泉,王文,周显良. 2000-Atmosphere Chip-Scale Packaged Bulk-Type Pressure Sensor with Dual-Cavity Induced Stress Amplification. 国家冰川冻土沙漠科学数据中心(http://www.ncdc.ac.cn), 2024. https://www.doi.org/10.1109/Transducers50396.2021.9495537.
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知识共享许可协议   本作品采用 知识共享署名 4.0 国际许可协议进行许可。

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